@misc{hu2023segmentdefectdetection,
    title={Segment Anything in Defect Detection}, 
    author={Bozhen Hu and Bin Gao and Cheng Tan and Tongle Wu and Stan Z. Li},
    year={2023},
    eprint={2311.10245},
    archivePrefix={arXiv},
    primaryClass={cs.CV},
    url={https://arxiv.org/abs/2311.10245}, 
}